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Properties of new materials for microchips can now be measured well - EurekAlert
<p>Scientists at Delft University of Technology, in collaboration with researchers from a Dutch chip-machine manufacturer, have taken an important step in the possible application of ultrathin 2D-materials for microchip manufacturing: they can now measure important performance properties of ultrathin silicon membranes. A major advantage of their method is that no physical contact needs to be made with the membrane, so pristine properties can be measured and no complex fabrication is required.</p>
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